The Principle of Hyperspectral Imaging
 
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Hyperspectral imaging systems are extending the 2D-information of a classical spectrometer to a 3rd dimension, the position (spatial resolution). These systems are well suited for efficient measurement of surfaces based on chemical and physical material properties.

 For a spectral analysis with spatial resolution based on conventional spectrometers, the measuring head or the object has to be moved well-defined. A hyperspectral imaging system simultaneously provides spectral and spatial information of an illuminated surface. In doing so one dimension of an area sensor represents the spectral and the other the spatial information. The measured values may be displayed in a 3D-space and results in a spectral image which shows the local information on one axis, the information of the wave length on the other axis and the information of the spectral intensity on a third axis of coordinates.
 
The Hyperspectral Imaging System HELIOS delivers a complete spectrum with a resolution of 320 data points for each local pixel of the monitored area. This is the strongest advantage in comparison to imaging systems measuring with just a few wavelengths because of analysing complete spectra of any pixel and calculating the 1st and 2nd derivation, highly inhomogeneous materials can be classified as well as inspected for many different anomalies in one step.

The tons of analysed data cause special needs of data processing which is also integrated in the HELIOS System based on a very high sophisticated FPGA-design.

For purposes of spectral imaging EVK offers smart camera modules, which online provide high quality spectra and parameters like "material classifiers" culminating in complete systems ready to use for sensor based sorting.